A simple formula for calculating the interfacial roughness of multilayer by using the smallAngle X ray diffraction curves of the samples is given.
提出一个利用多层膜小角X射线衍射谱衍射峰积分强度计算多层膜界面粗糙度的公式。
2
However, the diffraction peak of the original montmorillonite significantly shifts to smallangle, the layer distance increases more than three times.
结果发现,经直接混炼之后,有机蒙脱土的衍射峰向小角度偏移很小,层间距没有明显变化;
3
The change of the crystalline structure of UHMWPE fiber was studied by smallangle X-ray scattering (SAXS) , wide angle X-ray diffraction ( WAXD) and Raman spectroscopy.