Disclosed is a substantially tubular socketcontact.
本发明披露了基本管状插座接触件。
2
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
这个测试程序适用任何类型象针脚,插座,继电器,电线,连接器,印刷电路板等电流通道载体或其结合体。
3
Dust can easily lead to poor contactsocket and board, in addition, some CARDS on the motherboard, the form of chip pins, and is often due to oxidation and poor contact pin.