The purpose of this thesis is based on optical scanning systems to probe the inner structures of silicon IC chips by compendious and valid methods.
本论文是以光学扫瞄系统为基础，针对矽晶片内部的结构成像设计出有效方便的架构。
2
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.