Low current measurement applications include capacitor leakage, low current semiconductor, light, and ion beam measurements.
弱电流测量的各种应用包括电容器的漏电、弱电流半导体、光和离子束测量等。
2
Special probes have been designed for making resistivity measurements on semiconductor wafers and bars.
已经设计出专门的探头来测量半导体晶圆片和半导体棒的电阻率。
3
These measurements include temperature and ir drop at locations on the semiconductor substrate, along with the frequency response of integrated circuit.