Low current measurement applications include capacitor leakage, low current semiconductor, light, and ion beam measurements.
弱电流测量的各种应用包括电容器的漏电、弱电流半导体、光和离子束测量等。
2
The invention provides a semiconductor component and a method for manufacturing a metal-insulator-metal capacitor in a Mosaic structure.
本发明提供一半导体元件及制造镶嵌结构中的金属绝缘金属电容的方法。
3
Therefore, the metal oxide semiconductor can be used efficiently without additional manufacturing of a capacitor, and can save the chip size so as to reduce the cost.