The line width of nanostructures is influenced by many factors such as tip curvature radius, detained time in the base surface, scanning speed, humidity, surface roughness etc.
尖端曲率半径、针尖在基底表面滞留时间、针尖扫描速度、空气湿度、表面粗糙度等均会影响纳米结构的线宽。
2
The line broad increases and is changed into width with sample surface roughness.
线宽随着样品表面粗糙度增加而变宽。
3
It is also found that, when the water depth is fixed, the Manning roughness coefficient increases as the longitudinal pier spacing increases up to approximately the pier width.