英语词汇scan testability怎么读，是什么意思，单词翻译、读音、固定搭配用法和短语词组及例句-英汉双解词典

翻译

扫描可测试性

以上为机器翻译结果，快速获取精准的人工翻译结果，建议选择有道人工翻译

网络释义

短语

1
non scan design for testability
非扫描可测性设计
2
non-scan design for testability
非扫描可测性设计
3
non-scan des ign for testability
非扫描可测性设计

双语例句

1
An optimal sequencing of the storage elements in the single scan chain design for - testability is presented in the paper.
本文提出了扫描设计中存储元件在扫描链中的最优排序方法。
2
This paper chooses USB logic analyzer as a typical tested object, and carries through a second develop to design it supporting IEEE 1149.1 boundary-scan function for testability.
本文以usb逻辑分析仪作为一种典型的被测对象，进行了可测性设计的再开发工作，使其具有支持IEEE 1149.1边界扫描功能的设备结构。
3
There are some common methods of design for testability, such as boundary scan test and so on.
目前常见的可测试性设计方法主要有改善设计法、结构设计法和边界扫描测试法等几种。

单词	scan testability
释义	scan testability 翻译扫描可测试性以上为机器翻译结果，快速获取精准的人工翻译结果，建议选择有道人工翻译网络释义短语 1 non scan design for testability 非扫描可测性设计 2 non-scan design for testability 非扫描可测性设计 3 non-scan des ign for testability 非扫描可测性设计双语例句 1 An optimal sequencing of the storage elements in the single scan chain design for - testability is presented in the paper. 本文提出了扫描设计中存储元件在扫描链中的最优排序方法。 2 This paper chooses USB logic analyzer as a typical tested object, and carries through a second develop to design it supporting IEEE 1149.1 boundary-scan function for testability. 本文以usb逻辑分析仪作为一种典型的被测对象，进行了可测性设计的再开发工作，使其具有支持IEEE 1149.1边界扫描功能的设备结构。 3 There are some common methods of design for testability, such as boundary scan test and so on. 目前常见的可测试性设计方法主要有改善设计法、结构设计法和边界扫描测试法等几种。
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