The article describes a new method of measuring semiconductor laser spectrum by plane scanninginterferometer.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
2
The dynamic measurement characteristics of a novel wavelength scanninginterferometer for absolute distance measurement are analyzed in terms of theory.
对用于距离绝对测量的波长扫描干涉法的动态测量特性进行了分析。
3
In this thesis, a technique of scanning white-light interferometer in Michelson configuration is employed to measure and analyze the characteristics of different types of oil-film on water surface.