By scanningelectronicmicroscope (SEM) it was tested for the interfacial state and morphological structure of different composites.
应用扫描电子显微镜(SEM)分别对不同复合材料进行了界面形态和微观结构的研究。
2
X-ray diffraction (XRD) and scanningelectronicmicroscope (SEM) have been used to characterize the phase, orientation and surface morphology.
射线衍射和扫描电镜分别用于表征膜的物相、取向和表面形貌。
3
With the help of scanningelectronicmicroscope (SEM), the same conclusion is proved by the interfacial state and morphological structure of the composites.