High resolution transmission electron microscopy and selectedareaelectrondiffraction were used to characterize the products.
利用高分辨透射电镜和电子衍射仪器对合成的纳米颗粒的结构进行了表征。
2
The selectedareaelectrondiffraction (SAED) pattern of the twin was indexed by transforming matrix of hexagon crystal twin plan.
并采用六方晶系孪晶面的变换矩阵对孪晶电子衍射花样进行了标定。
3
The X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and selectedareaelectrondiffraction (SAED) results indicate that the sputtered film has an amorphous structure.