The available methods of Seebeckcoefficient of micro-scale material with MEMS structure were reviewed.
综述了微观尺度下利用MEMS结构测量硅材料塞贝克系数的已有工作。
2
The relationship of Seebeckcoefficient and electrical conductivity in different sintering temperatures was analyzed.
研究了这种热电材料的电导率、塞贝克系数与烧结温度的关系。
3
Seebeckcoefficient increased with increasing temperature and Y filling fraction, the maximum value of Seebeckcoefficient shifted towards low temperature.