An intelligent control system of high temperature environmental test for SOIdevice is introduced, which is based on the technology of bus integration.
本文介绍了基于总线集成控制技术设计的SOI器件高温环境实验装置的智能控制系统。
2
The improvement of retrograde structure PD SOI to SEU versus conventional PD SOI is intensively studied in the end, and the charge collection effects of SEE in SOIdevice are also simulated.
着重研究倒掺杂结构PD SOI器件较常规PD SOI 器件抗SEU能力的改善，并对SOI器件单粒子辐射的电荷收集效应进行了模拟与仿真。
3
SOI technology is used to reduce the device capacitance and increase transistor performance.