TEMs work by firing a beam of electrons through the material and measuring how it absorbs and deflects the particles to build up an image of the sample.
TEMs 的工作原理是通过发射一束电子穿过某种物质,并测量它如何吸收和偏转粒子来建立样本的图像。
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This photomicrograph was obtained by scanning a beam of electrons across the sample while a detector kept track of electrons bouncing off its surface, betraying the specimen's outer shape.
Then they brought the sample back to room temperature and exposed it to an X-ray beam from the facility while using a CCD detector to record the X-rays reflected from the surface of the sample.