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单词 secondary ion mass spectrometry
释义
secondary ion mass spectrometry
  • 简明释义
  • [物] 二次离子质谱法
  • 次级离子质谱法
  • 网络释义
  • 1

    ?次级离子质谱分析法

    ... secondary emission rate 二次发射率 secondary ion mass spectrometry 次级离子质谱分析法 secondary radar 二次雷达 ...

短语
  • 双语例句
  • 1
    Secondary ion mass spectrometry was used to measure the distribution of implanted depths of boron ions.
    用二次离子质谱测量了注入硼离子的深度分布。
  • 2
    Additionally, chemical composition and thickness of oxide layers, occurring in both studied cases, were analyzed by secondary ion mass spectrometry.
    此外,两种不同表面状态下的化学成分以及氧化层都通过二次离子质谱测定法进行了分析。
  • 3
    Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications.
    飞行时间二次离子质谱(TOF- SIMS)是一种非常灵敏的表面检测技术。
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更新时间:2025/10/5 9:20:53