Using these results, we discuss minority carrier lifetime and surface recombinationvelocity of some wafers.
可以使用这些结果讨论一些薄片的少子寿命和表面复合速度。
2
When the surface hole recombinationvelocity and defect density is bigger, the length of nanowire should not be too long.
当表面复合速率和体缺陷密度较大时，纳米柱的长度不宜过大。
3
This paper presents a new solution of minority carrier continuity equation for a wafer with different surface recombinationvelocity on its two surfaces.