Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface ofa sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面,能得到高分辨率的影像(约5纳米的分辨率)。
2
Therefore the dynamic force sensitivity and the resolutionofa conventional AFM are improved.
从而提高了原子力显微镜的动态力灵敏度和分辨力。
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Real time high resolution visual feedback and force feedback provide high fidelity for users, which explores a profitable path for the practical usage of virtual reality technology in surge…