If using a separate current source and voltmeter to make low resistance measurements, each instrument must be checked for non-ohmic contacts.
如果使用分离的电流源和电压表来进行低电阻测量，则必须检查每台仪器的非欧姆接触情况。
2
Very high ohmic value resistors may exhibit a significant change in resistance with a change in applied voltage.
当施加的电压变化时，非常高值电阻器的阻值可能会发生很大的变化。
3
In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.