It is showed that quasi-total reflection would occur when the electromagnetic wave traveled f.
曲线显示当电磁波由电导率大的介质向电导率小的介质传播时，将发生类全反射。
2
The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.