The rapid expansion of supercritical solution (RESS) process for particle encapsulation is a recently developed technology.
超临界溶液快速膨胀技术是一种新兴的超细粒子包覆技术。
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Hot-carrier-induced device degradations are also analyzed by st ress experiments under three typical hot-carrier injection conditions.
对三种典型的热载流子应力条件造成的器件退化进行实验。
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The rapid expansion of supercritical solution (RESS) and the gas anti-solvent (gas) precipitation are the new and promising methods of microparticle formation.