X-ray spectral lines emitted by high temperature plasma can be taken by means of crystal spectrograph in laser-plasma experiments.
在激光等离子体实验中，用晶体谱仪可获得高温等离子体所发射的X光谱。
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This paper presents the studies of the dependence of soft X-ray emission on atomic-number and laser intensities by using a new diagnostic tool, pinhole transmission grating spectrograph (PTGS).
In addition, the composition of bright Sn-Bi plated layer is analyzed using scanning electron microscope and X-ray energy spectrograph. The result shows Bi content is 1% and Sn content is 99%.