Quick scan, deep scan and partialscan feature gives you full recovery.
快速扫描,深度扫描和部分扫描功能为您提供完全恢复。
2
A partialscan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.
提出了一种在内建自测试(BIST)中进行部分扫描的算法,此算法综合了电路的结构分析和可测性分析。
3
An integrated circuit is described as comprising a plurality of logic elements (LEs), each of which having a plurality of outputs, and a partialscan register.