Aiming at the problem of testing parametric fault in analog integrated circuits, an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.
针对模拟集成电路参数型故障的测试难题，提出了定位模拟集成电路参数型故障的功率谱相关分析方法。
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Intraclass correlation coefficients are parametric measures of association or cor - relation, the models of whose computation involve one-way random, two-way mixed and two-way random models.