Based on the photoconductivemethod the Energy Gap Measuring Device for Semiconductor Material-Type DB-1 has been developed.
根据光电导方法,研制了DB - 1型半导体材料禁带宽度测试装置。
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The photoconductive cells should receive equal illumination from L1, a convenient method is to mount the cells in holes in an aluminum block and to mount the lamp midway between them.
The effects of surface thermal oxidation on the minority carrier lifetime of Czochralski (CZ) silicon wafers are investigated by photoconductive decay (PCD) method.