A method for measuring and controlling the junction temperature of power transistor during succession operationlifetest is proposed.
为了在试验周期中了解晶体管的结温，提出一种在功率晶体管稳态工作寿命试验过程中结温的测量与控制方法。
2
Analyzing result of simulated experiment data shows that the test method can increase availably the accuracy of the transistor steady-state operationlifetest method.
模拟试验数据分析结果表明，该试验方法可以有效地提高晶体管稳态工作寿命试验方法的可信度。
3
According to the conditions of ageing test within endurance test, the expected operationlife of a high-voltage shunt capacitor which operates under the standard condition is estimated.