The scatter rate of sulphur vacancy in thin film electroluminescent device is calculated through phaseshiftanalysis. The results are compared with other scatter mechanisms.
利用分波法计算了薄膜电致发光器件中硫空位对电子的散射速率,并将其与其它散射机制进行了比较。
2
With theoretical analysis and numeric calculation, it is found that the transverse nonlinear phaseshift caused by the sample can be very well fitted by a Gaussian function.
经过理论分析和数值计算,发现样品对光束横截面上产生的非线性相移非常近似于高斯分布。
3
The theoretical analysis of its accuracy is presented in the paper and the influence of random noise to phaseshift measurement is calculated.