A pseudo weak phaseobject approximation to the principle of image formation in high resolution electron microscopy is presented.
本文提出了高分辨电子显微象的赝弱相位物体近似。
2
The experiment shows that this method is suitable for the measurement of the phaseobject with the small sectional size and the small temperature gradient.
实验表明此方法适用于几何尺度较小或温度梯度较小的三维位相物体温度场的散斑照相测量。
3
In the system two coded gratings are inversely imaged to each other by a lens, and the tested phaseobject is placed between and imaged onto an observation screen.