However, instead of heating the entire sample, the researchers used a hot atomic force microscope (AFM) tip to convert very narrow ribbons, measuring just 12 nm across, into reduced graphene.
The method, developed with support from the Swiss National Science Foundation and the Packard Foundation, works by changing the programming that controls an Atomic Force Microscope (AFM).
该技术由瑞士国家科学基金会和帕卡德基金会提供资金支持，它通过编程来控制原子力显微镜（AFM）工作。
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While the research is still in its early days, it is possible that the new technique could be extended so that arrays of AFM tips rapidly write circuits at high rates across graphene wafers.