Processing time is further decreased by creating multiplescan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。
2
After using compatible compression of multiplescan chains to pretreat the merged test set, modified distance-marking method is used to compress test data.
先采用多扫描链相容压缩预处理总测试集，接着使用改进的距离标记法压缩测试数据。
3
For multiple index push-downs, multi-index scan is used to combine RIDs from different index scans, then skip-scan on the fact table is performed.