The basic principle and theoretic model of the detection are introduced. An auto detection system is built and a criterion of micro bulkdefect is advanced.
A detection method for obtaining the micro bulkdefect size in semiconductive materials by analyzing near infrared laser scattering light distribution is presented.
提出了利用近红外激光散射光强分布分析来检测半导体材料内部微体缺陷的检测方法。
3
The defect of sampling methods of bulk flotation zinc concentrates in the real application is expounded. Meanwhile, improvement methods is put forward and it is a good effect.