Numerical simulations of microscanning forces and micro topography are presented to investigate the influence of the coupling deformation of AFM probe under the AFM contact mode.
采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响。
2
These sections are dissected, using a laser, into slices a millimetre or less thick, and then scanned again, either with the micro-CT or with a scanning electron microscope.
采用激光将这些小岩石块切分成一毫米或不太厚的薄片,然后用微CT机或电子显微扫描镜对其再次扫描。
3
Colour-enhanced scanning electron micro-graph of the split end of a human hair showing the outer cuticle layer surrounding the inner cortical layer.