The ion-implantation damage defects and thermal stress during quenching step are responsible for the formation of dislocations.

Coating by physical vapour deposition (PVD), coating by chemical vapour deposition (CVD) and surface layer modification by ion implantation, all three are being tested and are partly in use.

Because the lithium drifting detector has the noise in a big way, unstable and so on the weakness, we have used the ion implantation PIN detector on the new generation of instrument.