Tip sample distance control system is the key part of scanning near field infraredmicroscopy.
针尖样品的距离控制系统是扫描近场红外显微镜的重要组成部分。
2
The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).
Then their structures and composing are analyzed by Fourier transform infrared spectroscopy(FT-IR), X-ray diffraction(X-RD), scanning electron microscopy(SEM).