The damage of the cytoskeleton system in the pollen and the pollen tube of Pinus thunbergii induced by ion beam implantation were researched.

The mechanism of radiation damage effects on electronic devices and the applications of ion beam analysis in the investigations of radiation hardening were presented in this paper.

Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.