The mechanism of radiation damage effects on electronic devices and the applications of ionbeamanalysis in the investigations of radiation hardening were presented in this paper.
本文介绍了核辐射使电子元器件失效的机制以及离子束分析技术在抗核加固研究中的若干应用。
2
The analysis results show that the solution of DT function exists for the ionbeam removal functions of Gaussian shape.
分析结果表明，对于高斯型的束函数，驻留函数解总是存在的。
3
The controller selects and adjusts composition of the gas and flow rate according to contaminants present within the ionbeam, or lack thereof, as well as total or partial pressure analysis.