The quantity conditions of film thickness and refractive index control were acquired. The basic facture technics of branched PMPS waveguide circuit was established.
实验归纳了支化聚甲基苯基硅烷薄膜的光折变规律，获得了控制薄膜厚度和折射率的定量条件。
2
The principle, circuit design and technical indexof the micrometer are presented.
本文介绍了该仪器的工作原理、测量电路的设计特点及其技术性能指标。
3
Experimental results indicate that the circuit does improve the indexof CSO and CTB.