The incident Angle dependences of the cross sections for single event upset and single event latchup are presented.
获得了单粒子翻转和单粒子闭锁截面与入射角度的依赖关系。
2
Latchup, matching and parasitic are considered to make sure the connection lines shortest and the cross points least, finally the chip area is estimated.
在放置器件时考虑可能出现的拴锁、匹配和寄生，使其之间的连线最短、交叉最少，并对芯片面积进行了估算。
3
In this paper, a new lumped elements latchup model consisting of four bipolar transistors is used to analyze the latchup effect of CMOS inverters in transient radiation environment.