The use of Scanning NearfieldAcoustic Microscope (SNAM) in measuring the topography of precise surface is presented.
描述了一种用于检测超精表面形貌的扫描近场声显微镜（SNAM）。
2
The expression for instantaneous pressure near the focusing area was obtained by analyzing the characteristic of focusing acousticfield.
通过分析聚焦声场的特性，得到了聚焦区附近的瞬时声压表达式。
3
A method to solve the scattering acousticfield of complex target was proposed for the near-field scattering characteristics of an underwater target in high-frequency.