In general, the halfwidth of X-ray diffraction is used as a strength index of material surface.
通常用X射线衍射线的半高宽作为材料表面的强度指标。
2
The spatial resolution of system can be measured directly or evaluated indirectly by the halfwidth of the Fresnel reflection at the end of the fiber.
系统的空间分辨率既可以直接测量,也可以通过测量光纤末端菲涅尔反射的半宽度来间接测量。
3
As metastable atoms deexcite, the vapor velocity and temperature increase, the peak value of the velocity distribution function shifts rightward, and the halfwidth increases.