The nanowires were analyzed by X-ray diffraction, highresolutionelectronmicroscopy (HREM), electron energy loss spectroscopy.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
2
A pseudo weak phase object approximation to the principle of image formation in highresolutionelectronmicroscopy is presented.
本文提出了高分辨电子显微象的赝弱相位物体近似。
3
"Highresolutionelectronmicroscopy for materials science". D. Shindo, K. Hiraga. Springer. 1998. Beautiful collection of HREM images and examples of their analysis.