The proposed method can generate simplified test patterns with highfaultcoverage, and can detect multiple faults as many as possible.
新方法可生成精简的、故障覆盖率高的测试图形,并尽可能多地检测多重故障。
2
Experimental results show that the proposed testing algorithms have merits such as highfaultcoverage, strong diagnostic ability and less testing time.
实验结果表明,此测试算法具有故障覆盖率高,诊断故障能力强,测试需要的时间少等优点。
3
This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with highfaultcoverage and short time is then presented fort…