The growth process of the films was in situ monitored by reflective highenergyelectrondiffraction (RHEED).
通过反射高能电子衍射(RHEED)仪原位实时监测薄膜生长,研究薄膜的生长过程。
2
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
3
Surface damage caused by cutting on Si, InSb, HgCdTe has been studied by Reflection HighEnergyElectronDiffraction (RHEED) after step-etching the samples.