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单词 scanning electron microscope
释义 scan·ning electron microscope AHD[skănʹĭng] D.J.[ˈskænɪŋ]K.K.[ˈskænɪŋ]n.(名词)abbr. SEM【缩写】
  1. An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and the secondary electrons produced by it.扫描电子显微镜:一种电子显微镜,通过移动电子光束掠过物体表面并探测到物体放出的电子和亚电子,从而在阴极射线管上形成三维图像
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